The main types of photoreceivers discussed below are those that can detect optical signals with fast temporal responses or those containing high frequency components as well as detectors that are sensitive to low light levels or small differential changes in signals. Depending on the type of semiconductor used, the detectors can have spectral sensitivities anywhere from the UV region of the spectrum to the NIR. Furthermore, depending on the application being targeted, they can possess either free-space or fiber-coupled configurations.
With the advancement of high-transmission-rate systems and short-pulse lasers, many applications now require high time-resolution or equivalently, high frequency-bandwidth optical detection. High-speed
photoreceivers are critical for the measurement of the frequency and/or time response of optical systems. In the optical domain, this can include measuring the pulses of mode-locked laser systems, detecting the data stream of a frequency-multiplexed communication system, or providing increased resolution in dynamic, pump-probe spectroscopy. The minimum rise time for high-speed photoreceivers is less than 10 ps. Consequently, for optical signals with faster responses, optical gating techniques are required (see
Laser Pulse Characterization). In the frequency domain, applications for high-speed photoreceivers include laser heterodyning experiments and millimeter-wave signal generation. The maximum frequency bandwidths for such detectors can exceed 50 GHz in well-designed devices.
Based on the discussion above, diffusion of carriers to the depletion region is a relatively slow process in reverse biased p-n junctions that could serve to limit the response time of a photoreceiver. To minimize this effect, a p-i-n photodiode is typically utilized where an un-doped intrinsic layer is sandwiched between the p and n layers in a p-n junction (see Figure 1). This structure effectively widens the depletion layer. This results in a greater proportion of the generated current being carried by the faster drift process instead of diffusion. The increased depletion width also allows for a reduction in the RC time constant (via a decreased junction capacitance) and increased area for capturing light. The p-i-n device structure is ubiquitous in high-speed photoreceivers and enables fast rise times and large bandwidths. However, the final measured optical signal will be as slow as the slowest component of a detection system even if a sufficiently fast photoreceiver is employed. Therefore, care should be taken when choosing connectors, cables, an oscilloscope, and a spectrum analyzer to measure a fast optical signal.